Time savings due to finished test board
Silicon carbide circuit breakers are central to more efficient power conversion. SiC FET and SiC Schottky diodes are used in AC/DC, DC/DC conversion. Before examining the circuit breakers, the selection of suitable components and the development of a layout minimized to stray effects already consumes a lot of time. With the BeFAST test board from Angst+Pfister Sensors + Power, customers can save about 3-4 weeks of development time.
BeFAST combines low-loss SiC FETs with the products necessary for efficient and safe operation to create a fully functional Half-Bridge. The layout was optimized in several development steps for stray effects. Customers receive a ready-made test board(dual-pulse test or load operation with heat sink) including Schematics, BOM and can go into their application much faster with the test result.
The BeFAST can already be adapted to the fourth generation (UJ4C) of SiC FET from UntiedSIC with little effort. To simplify this step, investigations were carried out for the 750V FET. Recommendations for using the UJ4C series and an upgrade kit are already available for purchase.