Power Conversion

Time savings due to finished test board

Silicon carbide circuit breakers are central to more efficient power conversion. SiC FET and SiC Schottky diodes are used in AC/DC, DC/DC conversion. Before examining the circuit breakers, the selection of suitable components and the development of a layout minimized to stray effects already consumes a lot of time. With the BeFAST test board from Angst+Pfister Sensors + Power, customers can save about 3-4 weeks of development time.  

BeFAST combines low-loss SiC FETs with the products necessary for efficient and safe operation to create a  fully functional  Half-Bridge. The layout was optimized in several development steps for stray effects. Customers receive a ready-made test board(dual-pulse test  or load operation with heat sink) including Schematics, BOM and can go into their application much faster with the test result.

The BeFAST can already be adapted to the fourth generation (UJ4C) of SiC FET from UntiedSIC with little effort. To simplify this step, investigations were carried out for the 750V FET. Recommendations for using the UJ4C series and an upgrade kit are already available for purchase.


SiC Cascoden FETs


UJ4C0750-Serie

Voltage [Vr]
750V
Current max [Id]
21A to 120A
RDS(on) typ
6 mOhm to 60 mOhm
Package
TO-247-3L, TO-247-4L

AP-EVAL-UJ4C075018K4S

Voltage [Vr]
750
Current max [Id]
81A
RDS(on) typ
18mOhm
Package
Evaluation Board

AP-EVAL-UF3SC120009K4S

Voltage [Vr]
1200V
Current max [Id]
120,0A
RDS(on) typ
9mOhm
Package
Evaluation Board

UF3SC120009K4S

Voltage [Vr]
1200V
Current max [Id]
120,0A
RDS(on) typ
8.6mOhm
Package
TO-247-4L

DC/DC Converters


MGJ2-Serie

Style
Printmodule
Input Voltage [VAC]
5,12,15,24
Output Power [W]
2
Number of Outputs
2

MGJ2D-SMD-Serie

Style
SMD
Input Voltage [VAC]
5,12,15
Output Power [W]
2
Number of Outputs
2

Temperature sensors assembly


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